Abstract
We present an approach to analyse near-field effects on nanostructured gold films by finite element simulations. The studied samples are formed by fabricating gold films near the percolation threshold and then applying laser damage. Resulting samples have complicated structures, which then was captured using scanning transmission electron microscopy (STEM) and the obtained dark field images are used to set up COMSOL simulations corresponding to actual structures.
Originalsprog | Engelsk |
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Titel | Proceedings of the 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017 |
Forlag | IEEE |
Publikationsdato | 2017 |
Sider | 5-6 |
Artikelnummer | 8009963 |
ISBN (Trykt) | 978-1-5090-5324-7 |
ISBN (Elektronisk) | 978-1-5090-5323-0 |
DOI | |
Status | Udgivet - 2017 |
Begivenhed | 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017 - Copenhagen, Danmark Varighed: 24. jul. 2017 → 28. jul. 2017 |
Konference
Konference | 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017 |
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Land/Område | Danmark |
By | Copenhagen |
Periode | 24/07/2017 → 28/07/2017 |