Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

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Resumé

Udgivelsesdato: SEP 15 2008
OriginalsprogEngelsk
TidsskriftSurface Science
Vol/bind602
Udgave nummer18
Sider (fra-til)3064-3070
Antal sider7
ISSN0039-6028
DOI
StatusUdgivet - 15. sep. 2008

Bibliografisk note

Paper id:: SURFACE SCIENCE

Citer dette

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title = "Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale",
abstract = "Udgivelsesdato: SEP 15 2008",
author = "Sven Tougaard",
note = "Paper id:: SURFACE SCIENCE",
year = "2008",
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doi = "10.1016/j.susc.2008.08.005",
language = "English",
volume = "602",
pages = "3064--3070",
journal = "Surface Science",
issn = "0039-6028",
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}

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale. / Tougaard, Sven.

I: Surface Science, Bind 602, Nr. 18, 15.09.2008, s. 3064-3070.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

AU - Tougaard, Sven

N1 - Paper id:: SURFACE SCIENCE

PY - 2008/9/15

Y1 - 2008/9/15

N2 - Udgivelsesdato: SEP 15 2008

AB - Udgivelsesdato: SEP 15 2008

U2 - 10.1016/j.susc.2008.08.005

DO - 10.1016/j.susc.2008.08.005

M3 - Journal article

VL - 602

SP - 3064

EP - 3070

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 18

ER -