A scanning near‐field optical microscope (SNOM) is used to directly map the propagation of light in a specially designed 50/50 photonic crystal (PC) Y‐splitter fabricated on silicon‐on‐insulator (SOI) wafers. SNOM images are obtained for TE‐ and TM‐polarized light in the wavelength range 1425–1570 nm. The recorded intensity distributions exhibit highly wavelength (and polarization) dependent intensity variations along the propagation direction, especially around the fork and bend regions. By comparing the SNOM images recorded in and after the PC Y‐splitter area, the features of light distribution are analysed for both polarizations.
|Tidsskrift||Physica Status Solidi. C, Current topics in solid state physics|
|Status||Udgivet - 2005|