Near-field characterization of ultra-thin metal films

D. I. Yakubovsky; A. V. Arsenin; R. V. Kirtaev; G. A. Ermolaev; Y. S. Stebunov; V. S. Volkov

doi:10.1088/1742-6596/1461/1/012193

Near-field characterization of ultra-thin metal films

D. I. Yakubovsky^*, A. V. Arsenin, R. V. Kirtaev, G. A. Ermolaev, Y. S. Stebunov, V. S. Volkov

^*Kontaktforfatter

Publikation: Bidrag til tidsskrift › Konferenceartikel › Forskning › peer review

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Abstract

Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS₂ films as well as on a pure Si/SiO₂ substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

Originalsprog	Engelsk
Artikelnummer	012193
Bogserie	Journal of Physics: Conference Series
Vol/bind	1461
Udgave nummer	1
Antal sider	4
ISSN	1742-6588
DOI	https://doi.org/10.1088/1742-6596/1461/1/012193
Status	Udgivet - 23. apr. 2020
Begivenhed	4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Rusland Varighed: 15. jul. 2019 → 19. jul. 2019

Konference

Konference	4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
Land/Område	Rusland
By	St. Petersburg
Periode	15/07/2019 → 19/07/2019
Sponsor	Bruker, INSCIENCE

Dokumenter og links

10.1088/1742-6596/1461/1/012193Licens: CC BY

Open Access VersionForlagets udgivne version, 954 KBLicens: CC BY

SDU link

Tjek adgangen til materialet i Syddansk Universitetsbiblioteks søgemaskine

Citationsformater

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title = "Near-field characterization of ultra-thin metal films",

abstract = "Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.",

author = "Yakubovsky, {D. I.} and Arsenin, {A. V.} and Kirtaev, {R. V.} and Ermolaev, {G. A.} and Stebunov, {Y. S.} and Volkov, {V. S.}",

year = "2020",

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doi = "10.1088/1742-6596/1461/1/012193",

language = "English",

volume = "1461",

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T1 - Near-field characterization of ultra-thin metal films

AU - Yakubovsky, D. I.

AU - Arsenin, A. V.

AU - Kirtaev, R. V.

AU - Ermolaev, G. A.

AU - Stebunov, Y. S.

AU - Volkov, V. S.

PY - 2020/4/23

Y1 - 2020/4/23

N2 - Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

AB - Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

U2 - 10.1088/1742-6596/1461/1/012193

DO - 10.1088/1742-6596/1461/1/012193

M3 - Conference article

AN - SCOPUS:85084135714

SN - 1742-6588

VL - 1461

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

M1 - 012193

T2 - 4th International Conference on Metamaterials and Nanophotonics, METANANO 2019

Y2 - 15 July 2019 through 19 July 2019

ER -

Near-field characterization of ultra-thin metal films

Abstract

Konference

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