Near-field characterization of ultra-thin metal films

D. I. Yakubovsky*, A. V. Arsenin, R. V. Kirtaev, G. A. Ermolaev, Y. S. Stebunov, V. S. Volkov

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Abstrakt

Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

OriginalsprogEngelsk
Artikelnummer012193
BogserieJournal of Physics: Conference Series
Vol/bind1461
Udgave nummer1
Antal sider4
ISSN1742-6588
DOI
StatusUdgivet - 23. apr. 2020
Begivenhed4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Rusland
Varighed: 15. jul. 201919. jul. 2019

Konference

Konference4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
LandRusland
BySt. Petersburg
Periode15/07/201919/07/2019
SponsorBruker, INSCIENCE

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