Near-field characterization of ultra-thin metal films

D. I. Yakubovsky*, A. V. Arsenin, R. V. Kirtaev, G. A. Ermolaev, Y. S. Stebunov, V. S. Volkov

*Kontaktforfatter for dette arbejde

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Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

BogserieJournal of Physics: Conference Series
Udgave nummer1
Antal sider4
StatusUdgivet - 23. apr. 2020
Begivenhed4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Rusland
Varighed: 15. jul. 201919. jul. 2019


Konference4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
BySt. Petersburg
SponsorBruker, INSCIENCE

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