Near-field characterization of planar photonic-crystal-waveguide structures

S.I. Bozhevolnyi, V.S. Volkov

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Udgivelsesdato: APR 15
OriginalsprogEngelsk
TidsskriftPhilosophical Transactions. Series A : Mathematical, physical, and engineering science
Vol/bind362
Udgave nummer1817
Sider (fra-til)757-769
Antal sider13
ISSN1364-503X
DOI
StatusUdgivet - 15. apr. 2004
Udgivet eksterntJa

Fingeraftryk

Near-field
Photonic crystals
Photonic Crystal
optical microscopes
Waveguide
near fields
Waveguides
Microscopes
photonics
waveguides
Scanning
scanning
Microscope
crystals
Ridge waveguides
Wavelength
propagation modes
Straight
wavelengths
Telecommunication

Citer dette

@article{7cc5e220443d11dd9fbe000ea68e967b,
title = "Near-field characterization of planar photonic-crystal-waveguide structures",
abstract = "Characterization of photonic–crystal–waveguide (PCW) structures at telecommunication wavelengths with a collection scanning near–field optical microscope (SNOM) is considered. The propagation of light in silicon–on–insulator PCWs, formed by removing a single row of holes in the triangular lattice and connecting to access ridge waveguides, is imaged with the SNOM. High–contrast and high–resolution SNOM images of PCW structures containing straight PCWs as well as 90° gradual and 60° sharp PCW bends are obtained in the wavelength range of 1520–1570 nm, allowing for the determination of PCW mode characteristics and bend loss. We relate optical–signal variations along straight PCWs to the interference between a quasi–homogeneous background field and Bloch harmonics of the PCW mode, and use spatial–frequency spectra of the intensity variations to determine the dispersion of the PCW mode propagation constant. The bend loss is evaluated using averaged signal cross–sections and taking into account the fact that the signal is proportional to the PCW mode amplitude. It is directly shown that the bend loss for 60° bends is significantly decreased for smoothened bends having one or three holes moved from the inner side of the bend corner to the outer one. The possibilities and limitations of SNOM imaging for the characterization of PCW structures are discussed.",
author = "S.I. Bozhevolnyi and V.S. Volkov",
year = "2004",
month = "4",
day = "15",
doi = "10.1098/rsta.2003.1345",
language = "English",
volume = "362",
pages = "757--769",
journal = "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences",
issn = "1364-503X",
publisher = "Royal Society Publishing",
number = "1817",

}

Near-field characterization of planar photonic-crystal-waveguide structures. / Bozhevolnyi, S.I.; Volkov, V.S.

I: Philosophical Transactions. Series A : Mathematical, physical, and engineering science, Bind 362, Nr. 1817, 15.04.2004, s. 757-769.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Near-field characterization of planar photonic-crystal-waveguide structures

AU - Bozhevolnyi, S.I.

AU - Volkov, V.S.

PY - 2004/4/15

Y1 - 2004/4/15

N2 - Characterization of photonic–crystal–waveguide (PCW) structures at telecommunication wavelengths with a collection scanning near–field optical microscope (SNOM) is considered. The propagation of light in silicon–on–insulator PCWs, formed by removing a single row of holes in the triangular lattice and connecting to access ridge waveguides, is imaged with the SNOM. High–contrast and high–resolution SNOM images of PCW structures containing straight PCWs as well as 90° gradual and 60° sharp PCW bends are obtained in the wavelength range of 1520–1570 nm, allowing for the determination of PCW mode characteristics and bend loss. We relate optical–signal variations along straight PCWs to the interference between a quasi–homogeneous background field and Bloch harmonics of the PCW mode, and use spatial–frequency spectra of the intensity variations to determine the dispersion of the PCW mode propagation constant. The bend loss is evaluated using averaged signal cross–sections and taking into account the fact that the signal is proportional to the PCW mode amplitude. It is directly shown that the bend loss for 60° bends is significantly decreased for smoothened bends having one or three holes moved from the inner side of the bend corner to the outer one. The possibilities and limitations of SNOM imaging for the characterization of PCW structures are discussed.

AB - Characterization of photonic–crystal–waveguide (PCW) structures at telecommunication wavelengths with a collection scanning near–field optical microscope (SNOM) is considered. The propagation of light in silicon–on–insulator PCWs, formed by removing a single row of holes in the triangular lattice and connecting to access ridge waveguides, is imaged with the SNOM. High–contrast and high–resolution SNOM images of PCW structures containing straight PCWs as well as 90° gradual and 60° sharp PCW bends are obtained in the wavelength range of 1520–1570 nm, allowing for the determination of PCW mode characteristics and bend loss. We relate optical–signal variations along straight PCWs to the interference between a quasi–homogeneous background field and Bloch harmonics of the PCW mode, and use spatial–frequency spectra of the intensity variations to determine the dispersion of the PCW mode propagation constant. The bend loss is evaluated using averaged signal cross–sections and taking into account the fact that the signal is proportional to the PCW mode amplitude. It is directly shown that the bend loss for 60° bends is significantly decreased for smoothened bends having one or three holes moved from the inner side of the bend corner to the outer one. The possibilities and limitations of SNOM imaging for the characterization of PCW structures are discussed.

U2 - 10.1098/rsta.2003.1345

DO - 10.1098/rsta.2003.1345

M3 - Journal article

VL - 362

SP - 757

EP - 769

JO - Philosophical Transactions A: Mathematical, Physical and Engineering Sciences

JF - Philosophical Transactions A: Mathematical, Physical and Engineering Sciences

SN - 1364-503X

IS - 1817

ER -