Nanoscale light field imaging with graphene

Tongcheng Yu; Francisco Rodriguez; Fred Schedin; Vasyl G. Kravets; Vladimir A. Zenin; Sergey I. Bozhevolnyi; Konstantin S. Novoselov; Alexander N. Grigorenko

doi:10.1038/s43246-022-00264-0

Nanoscale light field imaging with graphene

Tongcheng Yu, Francisco Rodriguez, Fred Schedin, Vasyl G. Kravets, Vladimir A. Zenin, Sergey I. Bozhevolnyi, Konstantin S. Novoselov, Alexander N. Grigorenko^*

^*Kontaktforfatter

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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Abstract

Modern nano-optics and nanophotonics rely heavily on the precise formation of nanostructured light fields. Accurate and deterministic light field formation and characterization are indispensable for device operation as well as for revealing the underlying physical mechanisms involved. Despite a significant progress made in detection of scattered light with extremely high precision down to 1 nm resolution, there are only a limited number of techniques for direct subwavelength light mapping which do not rely on measurements of light scattering, fluorescence, or non-linear light conversion. Hence, techniques for direct conversion of light to electrical signals with precise and non-destructive imaging of nanoscale light would be of great benefit. Here, we report a nanoscale light field imaging approach based on photodetection with a p-n junction that is induced and moved inside a graphene probe by gate voltage, formed by a set of external electrodes. The spatial resolution of this electrical scanning technique is determined by p-n junction width, reaching ~ 20 nm. The developed approach is demonstrated with mapping the electric field distribution of a plasmonic slot-waveguide at telecom wavelengths. Our method provides a non-invasive nanoscale light field imaging that ensures extremely high spatial resolution and precision.

Originalsprog	Engelsk
Artikelnummer	40
Tidsskrift	Communications Materials
Vol/bind	3
Udgave nummer	1
Antal sider	8
ISSN	2662-4443
DOI	https://doi.org/10.1038/s43246-022-00264-0
Status	Udgivet - dec. 2022

Bibliografisk note

Funding Information:
We acknowledge the support from the EU Graphene Flagship grant Core 3 (881603) and Graphene NOWNANO CDT programme funded by EPSRC grant EP/L01548X/1. F.S. was funded by European Graphene Flagship Project ERC Synergy grant Hetero2D. S.I.B. acknowledges the support from the Villum Kann Rasmussen Foundation. V.A.Z. acknowledges the financial support from Villum Fonden (Grant No. 16498).

Publisher Copyright:
© 2022, The Author(s).

Dokumenter og links

10.1038/s43246-022-00264-0Licens: CC BY

Open Access VersionForlagets udgivne version, 937 KBLicens: CC BY

Citationsformater

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abstract = "Modern nano-optics and nanophotonics rely heavily on the precise formation of nanostructured light fields. Accurate and deterministic light field formation and characterization are indispensable for device operation as well as for revealing the underlying physical mechanisms involved. Despite a significant progress made in detection of scattered light with extremely high precision down to 1 nm resolution, there are only a limited number of techniques for direct subwavelength light mapping which do not rely on measurements of light scattering, fluorescence, or non-linear light conversion. Hence, techniques for direct conversion of light to electrical signals with precise and non-destructive imaging of nanoscale light would be of great benefit. Here, we report a nanoscale light field imaging approach based on photodetection with a p-n junction that is induced and moved inside a graphene probe by gate voltage, formed by a set of external electrodes. The spatial resolution of this electrical scanning technique is determined by p-n junction width, reaching ~ 20 nm. The developed approach is demonstrated with mapping the electric field distribution of a plasmonic slot-waveguide at telecom wavelengths. Our method provides a non-invasive nanoscale light field imaging that ensures extremely high spatial resolution and precision.",

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AU - Yu, Tongcheng

AU - Rodriguez, Francisco

AU - Schedin, Fred

AU - Kravets, Vasyl G.

AU - Zenin, Vladimir A.

AU - Bozhevolnyi, Sergey I.

AU - Novoselov, Konstantin S.

AU - Grigorenko, Alexander N.

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N2 - Modern nano-optics and nanophotonics rely heavily on the precise formation of nanostructured light fields. Accurate and deterministic light field formation and characterization are indispensable for device operation as well as for revealing the underlying physical mechanisms involved. Despite a significant progress made in detection of scattered light with extremely high precision down to 1 nm resolution, there are only a limited number of techniques for direct subwavelength light mapping which do not rely on measurements of light scattering, fluorescence, or non-linear light conversion. Hence, techniques for direct conversion of light to electrical signals with precise and non-destructive imaging of nanoscale light would be of great benefit. Here, we report a nanoscale light field imaging approach based on photodetection with a p-n junction that is induced and moved inside a graphene probe by gate voltage, formed by a set of external electrodes. The spatial resolution of this electrical scanning technique is determined by p-n junction width, reaching ~ 20 nm. The developed approach is demonstrated with mapping the electric field distribution of a plasmonic slot-waveguide at telecom wavelengths. Our method provides a non-invasive nanoscale light field imaging that ensures extremely high spatial resolution and precision.

AB - Modern nano-optics and nanophotonics rely heavily on the precise formation of nanostructured light fields. Accurate and deterministic light field formation and characterization are indispensable for device operation as well as for revealing the underlying physical mechanisms involved. Despite a significant progress made in detection of scattered light with extremely high precision down to 1 nm resolution, there are only a limited number of techniques for direct subwavelength light mapping which do not rely on measurements of light scattering, fluorescence, or non-linear light conversion. Hence, techniques for direct conversion of light to electrical signals with precise and non-destructive imaging of nanoscale light would be of great benefit. Here, we report a nanoscale light field imaging approach based on photodetection with a p-n junction that is induced and moved inside a graphene probe by gate voltage, formed by a set of external electrodes. The spatial resolution of this electrical scanning technique is determined by p-n junction width, reaching ~ 20 nm. The developed approach is demonstrated with mapping the electric field distribution of a plasmonic slot-waveguide at telecom wavelengths. Our method provides a non-invasive nanoscale light field imaging that ensures extremely high spatial resolution and precision.

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Nanoscale light field imaging with graphene

Abstract

Bibliografisk note

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