Nanolithography based contacting method for electrical measurements on single template synthesized nanowires

S. Fusil, L. Piraux, Stefan Mátéfi-Tempfli, M. Mátéfi-Tempfli, S. Michotte, C.K. Saul, L.G. Pereira, K. Bouzehouane, V. Cros, C. Deranlot, J.-M. George

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

A reliable method enabling electrical measurements on single nanowires prepared by electrodeposition in an alumina template is described. This technique is based on electrically controlled nanoindentation of a thin insulating resist deposited on the top face of the template filled by the nanowires. We show that this method is very flexible, allowing us to electrically address single nanowires of controlled length down to 100 nm and of desired composition. Using this approach, current densities as large as 10 A cm were successfully injected through a point contact on a single magnetic multilayered nanowire. This demonstrates that the technique is very promising for the exploration of electrical spin injection in magnetic nanostructures.
OriginalsprogEngelsk
TidsskriftNanotechnology
Vol/bind16
Udgave nummer12
Sider (fra-til)2936-2940
Antal sider5
ISSN0957-4484
DOI
StatusUdgivet - 1. dec. 2005

Fingeraftryk

Nanolithography
Nanowires
Aluminum Oxide
Point contacts
Nanoindentation
Electrodeposition
Nanostructures
Current density
Alumina
Chemical analysis

Citer dette

Fusil, S., Piraux, L., Mátéfi-Tempfli, S., Mátéfi-Tempfli, M., Michotte, S., Saul, C. K., ... George, J-M. (2005). Nanolithography based contacting method for electrical measurements on single template synthesized nanowires. Nanotechnology, 16(12), 2936-2940. https://doi.org/10.1088/0957-4484/16/12/036
Fusil, S. ; Piraux, L. ; Mátéfi-Tempfli, Stefan ; Mátéfi-Tempfli, M. ; Michotte, S. ; Saul, C.K. ; Pereira, L.G. ; Bouzehouane, K. ; Cros, V. ; Deranlot, C. ; George, J.-M. / Nanolithography based contacting method for electrical measurements on single template synthesized nanowires. I: Nanotechnology. 2005 ; Bind 16, Nr. 12. s. 2936-2940.
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abstract = "A reliable method enabling electrical measurements on single nanowires prepared by electrodeposition in an alumina template is described. This technique is based on electrically controlled nanoindentation of a thin insulating resist deposited on the top face of the template filled by the nanowires. We show that this method is very flexible, allowing us to electrically address single nanowires of controlled length down to 100 nm and of desired composition. Using this approach, current densities as large as 10 A cm were successfully injected through a point contact on a single magnetic multilayered nanowire. This demonstrates that the technique is very promising for the exploration of electrical spin injection in magnetic nanostructures.",
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Fusil, S, Piraux, L, Mátéfi-Tempfli, S, Mátéfi-Tempfli, M, Michotte, S, Saul, CK, Pereira, LG, Bouzehouane, K, Cros, V, Deranlot, C & George, J-M 2005, 'Nanolithography based contacting method for electrical measurements on single template synthesized nanowires', Nanotechnology, bind 16, nr. 12, s. 2936-2940. https://doi.org/10.1088/0957-4484/16/12/036

Nanolithography based contacting method for electrical measurements on single template synthesized nanowires. / Fusil, S.; Piraux, L.; Mátéfi-Tempfli, Stefan; Mátéfi-Tempfli, M.; Michotte, S.; Saul, C.K.; Pereira, L.G.; Bouzehouane, K.; Cros, V.; Deranlot, C.; George, J.-M.

I: Nanotechnology, Bind 16, Nr. 12, 01.12.2005, s. 2936-2940.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Nanolithography based contacting method for electrical measurements on single template synthesized nanowires

AU - Fusil, S.

AU - Piraux, L.

AU - Mátéfi-Tempfli, Stefan

AU - Mátéfi-Tempfli, M.

AU - Michotte, S.

AU - Saul, C.K.

AU - Pereira, L.G.

AU - Bouzehouane, K.

AU - Cros, V.

AU - Deranlot, C.

AU - George, J.-M.

PY - 2005/12/1

Y1 - 2005/12/1

N2 - A reliable method enabling electrical measurements on single nanowires prepared by electrodeposition in an alumina template is described. This technique is based on electrically controlled nanoindentation of a thin insulating resist deposited on the top face of the template filled by the nanowires. We show that this method is very flexible, allowing us to electrically address single nanowires of controlled length down to 100 nm and of desired composition. Using this approach, current densities as large as 10 A cm were successfully injected through a point contact on a single magnetic multilayered nanowire. This demonstrates that the technique is very promising for the exploration of electrical spin injection in magnetic nanostructures.

AB - A reliable method enabling electrical measurements on single nanowires prepared by electrodeposition in an alumina template is described. This technique is based on electrically controlled nanoindentation of a thin insulating resist deposited on the top face of the template filled by the nanowires. We show that this method is very flexible, allowing us to electrically address single nanowires of controlled length down to 100 nm and of desired composition. Using this approach, current densities as large as 10 A cm were successfully injected through a point contact on a single magnetic multilayered nanowire. This demonstrates that the technique is very promising for the exploration of electrical spin injection in magnetic nanostructures.

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Fusil S, Piraux L, Mátéfi-Tempfli S, Mátéfi-Tempfli M, Michotte S, Saul CK et al. Nanolithography based contacting method for electrical measurements on single template synthesized nanowires. Nanotechnology. 2005 dec 1;16(12):2936-2940. https://doi.org/10.1088/0957-4484/16/12/036