Mapping of surface refractive-index distribution by reflection SNOM

Ilya Radko, Valentyn S. Volkov, Sergey I. Bozhevolnyi, Jes Henningsen, Jens Pedersen

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

Resumé

Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
OriginalsprogEngelsk
TitelProceedings SPIE
Antal sider7
Vol/bind2
ForlagSPIE - International Society for Optical Engineering
Publikationsdato2005
Udgave9
DOI
StatusUdgivet - 2005
BegivenhedNano- and Micro-Metrology -
Varighed: 24. aug. 2010 → …

Konference

KonferenceNano- and Micro-Metrology
Periode24/08/2010 → …

Fingeraftryk

near fields
refractivity
microscopy
scanning
fibers
profiles
optical communication
optical fibers
interference
sensitivity
rings
high resolution

Citer dette

Radko, I., Volkov, V. S., Bozhevolnyi, S. I., Henningsen, J., & Pedersen, J. (2005). Mapping of surface refractive-index distribution by reflection SNOM. I Proceedings SPIE (9 udg., Bind 2). SPIE - International Society for Optical Engineering. https://doi.org/10.1117/12.612554
Radko, Ilya ; Volkov, Valentyn S. ; Bozhevolnyi, Sergey I. ; Henningsen, Jes ; Pedersen, Jens. / Mapping of surface refractive-index distribution by reflection SNOM. Proceedings SPIE. Bind 2 9. udg. SPIE - International Society for Optical Engineering, 2005.
@inproceedings{82a46a90443d11dd9fbe000ea68e967b,
title = "Mapping of surface refractive-index distribution by reflection SNOM",
abstract = "Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.{\circledC} (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.",
author = "Ilya Radko and Volkov, {Valentyn S.} and Bozhevolnyi, {Sergey I.} and Jes Henningsen and Jens Pedersen",
year = "2005",
doi = "10.1117/12.612554",
language = "English",
volume = "2",
booktitle = "Proceedings SPIE",
publisher = "SPIE - International Society for Optical Engineering",
address = "United States",
edition = "9",

}

Radko, I, Volkov, VS, Bozhevolnyi, SI, Henningsen, J & Pedersen, J 2005, Mapping of surface refractive-index distribution by reflection SNOM. i Proceedings SPIE. 9 udg, bind 2, SPIE - International Society for Optical Engineering, Nano- and Micro-Metrology, 24/08/2010. https://doi.org/10.1117/12.612554

Mapping of surface refractive-index distribution by reflection SNOM. / Radko, Ilya; Volkov, Valentyn S.; Bozhevolnyi, Sergey I.; Henningsen, Jes; Pedersen, Jens.

Proceedings SPIE. Bind 2 9. udg. SPIE - International Society for Optical Engineering, 2005.

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

TY - GEN

T1 - Mapping of surface refractive-index distribution by reflection SNOM

AU - Radko, Ilya

AU - Volkov, Valentyn S.

AU - Bozhevolnyi, Sergey I.

AU - Henningsen, Jes

AU - Pedersen, Jens

PY - 2005

Y1 - 2005

N2 - Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

AB - Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

U2 - 10.1117/12.612554

DO - 10.1117/12.612554

M3 - Article in proceedings

VL - 2

BT - Proceedings SPIE

PB - SPIE - International Society for Optical Engineering

ER -

Radko I, Volkov VS, Bozhevolnyi SI, Henningsen J, Pedersen J. Mapping of surface refractive-index distribution by reflection SNOM. I Proceedings SPIE. 9 udg. Bind 2. SPIE - International Society for Optical Engineering. 2005 https://doi.org/10.1117/12.612554