Mapping of surface refractive-index distribution by reflection SNOM

Ilya Radko, Valentyn S. Volkov, Sergey I. Bozhevolnyi, Jes Henningsen, Jens Pedersen

Publikation: Kapitel i bog/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

Abstrakt

Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
OriginalsprogEngelsk
TitelProceedings SPIE
Antal sider7
Vol/bind2
ForlagSPIE - International Society for Optical Engineering
Publikationsdato2005
Udgave9
DOI
StatusUdgivet - 2005
BegivenhedNano- and Micro-Metrology -
Varighed: 24. aug. 2010 → …

Konference

KonferenceNano- and Micro-Metrology
Periode24/08/2010 → …

Fingeraftryk Dyk ned i forskningsemnerne om 'Mapping of surface refractive-index distribution by reflection SNOM'. Sammen danner de et unikt fingeraftryk.

Citationsformater