Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration

O. Tsilipakos, A. Pitilakis, T. V. Yioultsis, S. Papaioannou, K. Vyrsokinos, D. Kalavrouziotis, G. Giannoulis, D. Apostolopoulos, H. Avramopoulos, T. Tekin, M. Baus, M. Karl, K. Hassan, J. C. Weeber, L. Markey, A. Dereux, A. Kumar, S. I. Bozhevolnyi, N. Pleros, E. E. Kriezis

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

A comprehensive theoretical analysis of end-fire coupling between dielectric-loaded surface plasmon polariton and rib/wire silicon-on-insulator (SOI) waveguides is presented. Simulations are based on the 3-D vector finite element method. The geometrical parameters of the interface are varied in order to identify the ones leading to optimum performance, i.e., maximum coupling efficiency. Fabrication tolerances about the optimum parameter values are also assessed. In addition, the effect of a longitudinal metallic stripe gap on coupling efficiency is quantified, since such gaps have been observed in fabricated structures.
OriginalsprogEngelsk
TidsskriftI E E E Journal of Quantum Electronics
Vol/bind48
Udgave nummer5
Sider (fra-til)678-687
ISSN0018-9197
DOI
StatusUdgivet - 2012

Fingeraftryk

Photonics
Waveguides
Demonstrations
Wire
photonics
waveguides
Silicon
silicon
Insertion losses
insulators
wire
Fires
Finite element method
insertion loss
Fabrication
polaritons
finite element method
fabrication
simulation

Citer dette

Tsilipakos, O., Pitilakis, A., Yioultsis, T. V., Papaioannou, S., Vyrsokinos, K., Kalavrouziotis, D., ... Kriezis, E. E. (2012). Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration. I E E E Journal of Quantum Electronics, 48(5), 678-687. https://doi.org/10.1109/jqe.2012.2189757
Tsilipakos, O. ; Pitilakis, A. ; Yioultsis, T. V. ; Papaioannou, S. ; Vyrsokinos, K. ; Kalavrouziotis, D. ; Giannoulis, G. ; Apostolopoulos, D. ; Avramopoulos, H. ; Tekin, T. ; Baus, M. ; Karl, M. ; Hassan, K. ; Weeber, J. C. ; Markey, L. ; Dereux, A. ; Kumar, A. ; Bozhevolnyi, S. I. ; Pleros, N. ; Kriezis, E. E. / Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration. I: I E E E Journal of Quantum Electronics. 2012 ; Bind 48, Nr. 5. s. 678-687.
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title = "Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration",
abstract = "A comprehensive theoretical analysis of end-fire coupling between dielectric-loaded surface plasmon polariton and rib/wire silicon-on-insulator (SOI) waveguides is presented. Simulations are based on the 3-D vector finite element method. The geometrical parameters of the interface are varied in order to identify the ones leading to optimum performance, i.e., maximum coupling efficiency. Fabrication tolerances about the optimum parameter values are also assessed. In addition, the effect of a longitudinal metallic stripe gap on coupling efficiency is quantified, since such gaps have been observed in fabricated structures. Finally, theoretical results are compared against insertion loss measurements, carried out for two distinct sets of samples comprising rib and wire SOI waveguides, respectively.",
author = "O. Tsilipakos and A. Pitilakis and Yioultsis, {T. V.} and S. Papaioannou and K. Vyrsokinos and D. Kalavrouziotis and G. Giannoulis and D. Apostolopoulos and H. Avramopoulos and T. Tekin and M. Baus and M. Karl and K. Hassan and Weeber, {J. C.} and L. Markey and A. Dereux and A. Kumar and Bozhevolnyi, {S. I.} and N. Pleros and Kriezis, {E. E.}",
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language = "English",
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Tsilipakos, O, Pitilakis, A, Yioultsis, TV, Papaioannou, S, Vyrsokinos, K, Kalavrouziotis, D, Giannoulis, G, Apostolopoulos, D, Avramopoulos, H, Tekin, T, Baus, M, Karl, M, Hassan, K, Weeber, JC, Markey, L, Dereux, A, Kumar, A, Bozhevolnyi, SI, Pleros, N & Kriezis, EE 2012, 'Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration', I E E E Journal of Quantum Electronics, bind 48, nr. 5, s. 678-687. https://doi.org/10.1109/jqe.2012.2189757

Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration. / Tsilipakos, O.; Pitilakis, A.; Yioultsis, T. V.; Papaioannou, S.; Vyrsokinos, K.; Kalavrouziotis, D.; Giannoulis, G.; Apostolopoulos, D.; Avramopoulos, H.; Tekin, T.; Baus, M.; Karl, M.; Hassan, K.; Weeber, J. C.; Markey, L.; Dereux, A.; Kumar, A.; Bozhevolnyi, S. I.; Pleros, N.; Kriezis, E. E.

I: I E E E Journal of Quantum Electronics, Bind 48, Nr. 5, 2012, s. 678-687.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Interfacing Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides: Theoretical Analysis and Experimental Demonstration

AU - Tsilipakos, O.

AU - Pitilakis, A.

AU - Yioultsis, T. V.

AU - Papaioannou, S.

AU - Vyrsokinos, K.

AU - Kalavrouziotis, D.

AU - Giannoulis, G.

AU - Apostolopoulos, D.

AU - Avramopoulos, H.

AU - Tekin, T.

AU - Baus, M.

AU - Karl, M.

AU - Hassan, K.

AU - Weeber, J. C.

AU - Markey, L.

AU - Dereux, A.

AU - Kumar, A.

AU - Bozhevolnyi, S. I.

AU - Pleros, N.

AU - Kriezis, E. E.

PY - 2012

Y1 - 2012

N2 - A comprehensive theoretical analysis of end-fire coupling between dielectric-loaded surface plasmon polariton and rib/wire silicon-on-insulator (SOI) waveguides is presented. Simulations are based on the 3-D vector finite element method. The geometrical parameters of the interface are varied in order to identify the ones leading to optimum performance, i.e., maximum coupling efficiency. Fabrication tolerances about the optimum parameter values are also assessed. In addition, the effect of a longitudinal metallic stripe gap on coupling efficiency is quantified, since such gaps have been observed in fabricated structures. Finally, theoretical results are compared against insertion loss measurements, carried out for two distinct sets of samples comprising rib and wire SOI waveguides, respectively.

AB - A comprehensive theoretical analysis of end-fire coupling between dielectric-loaded surface plasmon polariton and rib/wire silicon-on-insulator (SOI) waveguides is presented. Simulations are based on the 3-D vector finite element method. The geometrical parameters of the interface are varied in order to identify the ones leading to optimum performance, i.e., maximum coupling efficiency. Fabrication tolerances about the optimum parameter values are also assessed. In addition, the effect of a longitudinal metallic stripe gap on coupling efficiency is quantified, since such gaps have been observed in fabricated structures. Finally, theoretical results are compared against insertion loss measurements, carried out for two distinct sets of samples comprising rib and wire SOI waveguides, respectively.

U2 - 10.1109/jqe.2012.2189757

DO - 10.1109/jqe.2012.2189757

M3 - Journal article

VL - 48

SP - 678

EP - 687

JO - I E E E Journal of Quantum Electronics

JF - I E E E Journal of Quantum Electronics

SN - 0018-9197

IS - 5

ER -