In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2

Zacarias Eduardo Fabrim, Jakob Kjelstrup-Hansen, Paulo F. P. Fichtner

Publikation: Konferencebidrag uden forlag/tidsskriftPosterForskning

Resumé

In this work we show the dewetting process of the CdSe thin films induced by electron beam irradiation. A multilayer heterostructure of SiO2/CdSe/SiO2 was made by a magnetron sputtering process. A plan-view (PV) sample was irradiated with 200 kV electrons in the TEM with two current densities: 0.33 A.cm2 and 1.0 A.cm2 and at 80 kV with 0.37 A.cm2. The dewetting of the CdSe film is inferred by a number of micrographs taken during the irradiation. The microstructural changes were analyzed under the assumption of being induced by ballistic collision effects in the absence of sample heating.
OriginalsprogEngelsk
Publikationsdato23. jul. 2015
StatusUdgivet - 23. jul. 2015
BegivenhedAdvanced In Situ TEM/STEM: Current Trends and Future Needs in Imaging, In Situ Studies and Spectroscopy of Devices, Materials and Nanostructures - Gothenburg, Sverige
Varighed: 20. jul. 201523. jul. 2015

Workshop

WorkshopAdvanced In Situ TEM/STEM
LandSverige
ByGothenburg
Periode20/07/201523/07/2015

Fingeraftryk

drying
electron beams
irradiation
thin films
ballistics
magnetron sputtering
current density
transmission electron microscopy
heating
collisions
electrons

Citer dette

Fabrim, Z. E., Kjelstrup-Hansen, J., & Fichtner, P. F. P. (2015). In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2. Poster session præsenteret på Advanced In Situ TEM/STEM, Gothenburg, Sverige.
Fabrim, Zacarias Eduardo ; Kjelstrup-Hansen, Jakob ; Fichtner, Paulo F. P. / In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2. Poster session præsenteret på Advanced In Situ TEM/STEM, Gothenburg, Sverige.
@conference{9119e84f9bff4acbbeb680e160eb2ed2,
title = "In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2",
abstract = "In this work we show the dewetting process of the CdSe thin films induced by electron beam irradiation. A multilayer heterostructure of SiO2/CdSe/SiO2 was made by a magnetron sputtering process. A plan-view (PV) sample was irradiated with 200 kV electrons in the TEM with two current densities: 0.33 A.cm2 and 1.0 A.cm2 and at 80 kV with 0.37 A.cm2. The dewetting of the CdSe film is inferred by a number of micrographs taken during the irradiation. The microstructural changes were analyzed under the assumption of being induced by ballistic collision effects in the absence of sample heating.",
author = "Fabrim, {Zacarias Eduardo} and Jakob Kjelstrup-Hansen and Fichtner, {Paulo F. P.}",
year = "2015",
month = "7",
day = "23",
language = "English",
note = "Advanced In Situ TEM/STEM : Current Trends and Future Needs in Imaging, In Situ Studies and Spectroscopy of Devices, Materials and Nanostructures ; Conference date: 20-07-2015 Through 23-07-2015",

}

Fabrim, ZE, Kjelstrup-Hansen, J & Fichtner, PFP 2015, 'In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2', Advanced In Situ TEM/STEM, Gothenburg, Sverige, 20/07/2015 - 23/07/2015.

In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2. / Fabrim, Zacarias Eduardo; Kjelstrup-Hansen, Jakob; Fichtner, Paulo F. P.

2015. Poster session præsenteret på Advanced In Situ TEM/STEM, Gothenburg, Sverige.

Publikation: Konferencebidrag uden forlag/tidsskriftPosterForskning

TY - CONF

T1 - In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2

AU - Fabrim, Zacarias Eduardo

AU - Kjelstrup-Hansen, Jakob

AU - Fichtner, Paulo F. P.

PY - 2015/7/23

Y1 - 2015/7/23

N2 - In this work we show the dewetting process of the CdSe thin films induced by electron beam irradiation. A multilayer heterostructure of SiO2/CdSe/SiO2 was made by a magnetron sputtering process. A plan-view (PV) sample was irradiated with 200 kV electrons in the TEM with two current densities: 0.33 A.cm2 and 1.0 A.cm2 and at 80 kV with 0.37 A.cm2. The dewetting of the CdSe film is inferred by a number of micrographs taken during the irradiation. The microstructural changes were analyzed under the assumption of being induced by ballistic collision effects in the absence of sample heating.

AB - In this work we show the dewetting process of the CdSe thin films induced by electron beam irradiation. A multilayer heterostructure of SiO2/CdSe/SiO2 was made by a magnetron sputtering process. A plan-view (PV) sample was irradiated with 200 kV electrons in the TEM with two current densities: 0.33 A.cm2 and 1.0 A.cm2 and at 80 kV with 0.37 A.cm2. The dewetting of the CdSe film is inferred by a number of micrographs taken during the irradiation. The microstructural changes were analyzed under the assumption of being induced by ballistic collision effects in the absence of sample heating.

M3 - Poster

ER -

Fabrim ZE, Kjelstrup-Hansen J, Fichtner PFP. In situ observation of electron-beam-induced dewetting of CdSe thin film embedded in SiO2. 2015. Poster session præsenteret på Advanced In Situ TEM/STEM, Gothenburg, Sverige.