High-resolution second-harmonic microscopy of poled silica waveguides

J. Beermann, Sergei I. Bozhevolnyi, Kjeld Pedersen, J. Fage-Pedersen

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Udgivelsesdato: JUN 15
OriginalsprogEngelsk
TidsskriftOptics Communications
Vol/bind221
Udgave nummer4-6
Sider (fra-til)295-300
ISSN0030-4018
DOI
StatusUdgivet - 15. jun. 2003
Udgivet eksterntJa

Fingeraftryk

Silicon Dioxide
Optical microscopy
Microscopic examination
Waveguides
Silica
silicon dioxide
microscopy
waveguides
Scanning
harmonics
scanning
high resolution
nonlinearity
Pumps
pumps
harmonic radiation
Domain walls
domain wall
spatial resolution
Electric fields

Citer dette

Beermann, J. ; Bozhevolnyi, Sergei I. ; Pedersen, Kjeld ; Fage-Pedersen, J. / High-resolution second-harmonic microscopy of poled silica waveguides. I: Optics Communications. 2003 ; Bind 221, Nr. 4-6. s. 295-300.
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title = "High-resolution second-harmonic microscopy of poled silica waveguides",
abstract = "A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 μm. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ∼10 pm/V in the area of UV-written waveguides.",
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High-resolution second-harmonic microscopy of poled silica waveguides. / Beermann, J.; Bozhevolnyi, Sergei I.; Pedersen, Kjeld; Fage-Pedersen, J.

I: Optics Communications, Bind 221, Nr. 4-6, 15.06.2003, s. 295-300.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - High-resolution second-harmonic microscopy of poled silica waveguides

AU - Beermann, J.

AU - Bozhevolnyi, Sergei I.

AU - Pedersen, Kjeld

AU - Fage-Pedersen, J.

PY - 2003/6/15

Y1 - 2003/6/15

N2 - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 μm. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ∼10 pm/V in the area of UV-written waveguides.

AB - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 μm. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ∼10 pm/V in the area of UV-written waveguides.

U2 - 10.1016/S0030-4018(03)01426-3

DO - 10.1016/S0030-4018(03)01426-3

M3 - Journal article

VL - 221

SP - 295

EP - 300

JO - Optics Communications

JF - Optics Communications

SN - 0030-4018

IS - 4-6

ER -