Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

Alwin Klick, Malte Großmann, Maria Beewen, Paul Bittorf, Jacek Fiutowski, Till Leißner, Horst-Günter Rubahn, Carsten Reinhardt, Hans-Joachim Elmers, Michael Bauer

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.
OriginalsprogEngelsk
Artikelnummer053704
TidsskriftReview of Scientific Instruments
Vol/bind90
Udgave nummer5
Antal sider7
ISSN0034-6748
DOI
StatusUdgivet - 16. maj 2019

Fingeraftryk

Photoemission
Electron microscopy
electron microscopy
photoelectric emission
Lighting
illumination
Ultrashort pulses
Laser pulses
Photons
incidence
Geometry
pulses
polaritons
illuminating
excitation
lasers
propagation
photons
geometry

Citer dette

Klick, Alwin ; Großmann, Malte ; Beewen, Maria ; Bittorf, Paul ; Fiutowski, Jacek ; Leißner, Till ; Rubahn, Horst-Günter ; Reinhardt, Carsten ; Elmers, Hans-Joachim ; Bauer, Michael. / Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side. I: Review of Scientific Instruments. 2019 ; Bind 90, Nr. 5.
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abstract = "We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.",
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Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side. / Klick, Alwin; Großmann, Malte; Beewen, Maria; Bittorf, Paul; Fiutowski, Jacek; Leißner, Till; Rubahn, Horst-Günter; Reinhardt, Carsten; Elmers, Hans-Joachim; Bauer, Michael.

I: Review of Scientific Instruments, Bind 90, Nr. 5, 053704, 16.05.2019.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

AU - Klick, Alwin

AU - Großmann, Malte

AU - Beewen, Maria

AU - Bittorf, Paul

AU - Fiutowski, Jacek

AU - Leißner, Till

AU - Rubahn, Horst-Günter

AU - Reinhardt, Carsten

AU - Elmers, Hans-Joachim

AU - Bauer, Michael

PY - 2019/5/16

Y1 - 2019/5/16

N2 - We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.

AB - We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.

U2 - 10.1063/1.5088031

DO - 10.1063/1.5088031

M3 - Journal article

C2 - 31153234

VL - 90

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

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ER -