Exciton-polaron quenching in organic thin-film transistors studied by fluorescence lifetime imaging microscopy

Organic semiconductors show great potential in electronic and optical applications. However, a major challenge is the degradation of the semiconductor materials that cause a reduction in device performance. Here, we present our investigations of Organic Thin Film Transistors (OTFT) based on the material 5,5-bis(naphthyl)-2,20-bithiophene (NaT2). These types of OTFT have previously been shown to have light emitting properties. Fluorescence Lifetime Imaging Microscopy (FLIM) has been used to investigate the exciton-polaron quenching in biased OTFTs. A clear reduction in fluorescence lifetime that correlates with the local charge density indicates a pronounced exciton quenching by the injected charges. Subsequent FLIM measurements on previously biased OTFT devices show a general decrease in fluorescence lifetime suggesting degradation of the organic semiconductor. This is correlated with the results from electrical transport measurements that yielded the hole mobility and threshold voltage.