Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box

Morten Sorensen*, Ondrej Franek, Gert Frølund Pedersen, Andriy Radchenko, Keong Kam, David Pommerenke

*Kontaktforfatter for dette arbejde

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Resumé

Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.

OriginalsprogEngelsk
TitelEMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
Publikationsdato1. dec. 2012
Artikelnummer6396677
ISBN (Trykt)9781467307185
DOI
StatusUdgivet - 1. dec. 2012
BegivenhedInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 - Rome, Italien
Varighed: 17. sep. 201221. sep. 2012

Konference

KonferenceInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012
LandItalien
ByRome
Periode17/09/201221/09/2012
NavnIEEE International Symposium on Electromagnetic Compatibility
ISSN1077-4076

Fingeraftryk

numerical method
prediction
simulation
need
evaluation

Citer dette

Sorensen, M., Franek, O., Pedersen, G. F., Radchenko, A., Kam, K., & Pommerenke, D. (2012). Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box. I EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings [6396677] IEEE International Symposium on Electromagnetic Compatibility https://doi.org/10.1109/EMCEurope.2012.6396677
Sorensen, Morten ; Franek, Ondrej ; Pedersen, Gert Frølund ; Radchenko, Andriy ; Kam, Keong ; Pommerenke, David. / Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data : Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box. EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings. 2012. (IEEE International Symposium on Electromagnetic Compatibility).
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abstract = "Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.",
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Sorensen, M, Franek, O, Pedersen, GF, Radchenko, A, Kam, K & Pommerenke, D 2012, Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box. i EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings., 6396677, IEEE International Symposium on Electromagnetic Compatibility, International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012, Rome, Italien, 17/09/2012. https://doi.org/10.1109/EMCEurope.2012.6396677

Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data : Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box. / Sorensen, Morten; Franek, Ondrej; Pedersen, Gert Frølund; Radchenko, Andriy; Kam, Keong; Pommerenke, David.

EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings. 2012. 6396677 (IEEE International Symposium on Electromagnetic Compatibility).

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

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AU - Sorensen, Morten

AU - Franek, Ondrej

AU - Pedersen, Gert Frølund

AU - Radchenko, Andriy

AU - Kam, Keong

AU - Pommerenke, David

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Sorensen M, Franek O, Pedersen GF, Radchenko A, Kam K, Pommerenke D. Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box. I EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings. 2012. 6396677. (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/EMCEurope.2012.6396677