Electronic and Optical Properties of La-aluminate Thin Films on Si (100)

Publikation: Konferencebidrag uden forlag/tidsskriftPaperForskning

OriginalsprogEngelsk
Publikationsdato2009
StatusUdgivet - 2009
Begivenhed7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09 - Maui, USA
Varighed: 6. dec. 200911. dec. 2009

Konference

Konference7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09
LandUSA
ByMaui
Periode06/12/200911/12/2009

Citer dette

Tougaard, S. M. (2009). Electronic and Optical Properties of La-aluminate Thin Films on Si (100). Paper præsenteret på 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, Maui, USA.
Tougaard, Sven Mosbæk. / Electronic and Optical Properties of La-aluminate Thin Films on Si (100). Paper præsenteret på 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, Maui, USA.
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title = "Electronic and Optical Properties of La-aluminate Thin Films on Si (100)",
author = "Tougaard, {Sven Mosb{\ae}k}",
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language = "English",
note = "null ; Conference date: 06-12-2009 Through 11-12-2009",

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Tougaard, SM 2009, 'Electronic and Optical Properties of La-aluminate Thin Films on Si (100)', Paper fremlagt ved 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, Maui, USA, 06/12/2009 - 11/12/2009.

Electronic and Optical Properties of La-aluminate Thin Films on Si (100). / Tougaard, Sven Mosbæk.

2009. Paper præsenteret på 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, Maui, USA.

Publikation: Konferencebidrag uden forlag/tidsskriftPaperForskning

TY - CONF

T1 - Electronic and Optical Properties of La-aluminate Thin Films on Si (100)

AU - Tougaard, Sven Mosbæk

PY - 2009

Y1 - 2009

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Tougaard SM. Electronic and Optical Properties of La-aluminate Thin Films on Si (100). 2009. Paper præsenteret på 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, Maui, USA.