@inproceedings{682b234df93149e2b8fcf1ff24cc06af,
title = "Effect investigations of double pulse test on the wide bandgap power devices",
abstract = "This paper addresses the investigations of the probe depending effects on the dynamic characteristics for a commercial SiC MOSFET. A double pulse test with a clamped inductive load has been used for the analysis on the switching behaviors of the devices under test (DUT). Then these switching characteristics are investigated under different voltage and current measurements in order to define a standard measurement guideline for the final test setup. In this paper, a 1,2kV SiC MOSFET is evaluated in terms of turn on and turn off voltage and current measurement.",
author = "Fu, {Jian Zhi} and Giorgo Kapino and Franke, {Wulf Toke}",
year = "2020",
language = "English",
isbn = "9783800752454",
series = "PCIM Europe Conference Proceedings",
pages = "1202--1207",
booktitle = "PCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2020",
publisher = "Mesago PCIM GmbH",
note = "International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2020 ; Conference date: 07-07-2020 Through 08-07-2020",
}