Determination of overlayer thickness by QUASES analysis of photon excited KLL Auger spectra of Ni and Cu films

L. Kövér, S. Tougaard, J. Tóth, L. Daróczi, I. Szabó, G. Langer, M. Menyhárd

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    OriginalsprogEngelsk
    TidsskriftSurface and Interface Analysis
    Vol/bind31
    Sider (fra-til)271B9
    ISSN0142-2421
    DOI
    StatusUdgivet - 2001

    Citer dette

    Kövér, L. ; Tougaard, S. ; Tóth, J. ; Daróczi, L. ; Szabó, I. ; Langer, G. ; Menyhárd, M. / Determination of overlayer thickness by QUASES analysis of photon excited KLL Auger spectra of Ni and Cu films. I: Surface and Interface Analysis. 2001 ; Bind 31. s. 271B9.
    @article{c9d47630ba9511dc9626000ea68e967b,
    title = "Determination of overlayer thickness by QUASES analysis of photon excited KLL Auger spectra of Ni and Cu films",
    author = "L. K{\"o}v{\'e}r and S. Tougaard and J. T{\'o}th and L. Dar{\'o}czi and I. Szab{\'o} and G. Langer and M. Menyh{\'a}rd",
    year = "2001",
    doi = "10.1002/sia.988",
    language = "English",
    volume = "31",
    pages = "271B9",
    journal = "Surface and Interface Analysis",
    issn = "0142-2421",
    publisher = "JohnWiley & Sons Ltd.",

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    Determination of overlayer thickness by QUASES analysis of photon excited KLL Auger spectra of Ni and Cu films. / Kövér, L.; Tougaard, S.; Tóth, J.; Daróczi, L.; Szabó, I.; Langer, G.; Menyhárd, M.

    I: Surface and Interface Analysis, Bind 31, 2001, s. 271B9.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    TY - JOUR

    T1 - Determination of overlayer thickness by QUASES analysis of photon excited KLL Auger spectra of Ni and Cu films

    AU - Kövér, L.

    AU - Tougaard, S.

    AU - Tóth, J.

    AU - Daróczi, L.

    AU - Szabó, I.

    AU - Langer, G.

    AU - Menyhárd, M.

    PY - 2001

    Y1 - 2001

    U2 - 10.1002/sia.988

    DO - 10.1002/sia.988

    M3 - Journal article

    VL - 31

    SP - 271B9

    JO - Surface and Interface Analysis

    JF - Surface and Interface Analysis

    SN - 0142-2421

    ER -