Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K- Auger and K- conversion Spectra Emitted from Thin Films

L. Köver, S. Tougaard, J. Toth, D. Varga, O. Dragoun, A. Koval'k, M. Rysavy

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    OriginalsprogEngelsk
    TidsskriftJournal of Surface Analysis
    Vol/bind9
    Sider (fra-til)281-4
    ISSN1341-1756
    StatusUdgivet - 2002

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    title = "Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K- Auger and K- conversion Spectra Emitted from Thin Films",
    author = "L. K{\"o}ver and S. Tougaard and J. Toth and D. Varga and O. Dragoun and A. Koval'k and M. Rysavy",
    year = "2002",
    language = "English",
    volume = "9",
    pages = "281--4",
    journal = "Journal of Surface Analysis",
    issn = "1341-1756",
    publisher = "Surface Analysis Society of Japan",

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    Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K- Auger and K- conversion Spectra Emitted from Thin Films. / Köver, L.; Tougaard, S.; Toth, J.; Varga, D.; Dragoun, O.; Koval'k, A.; Rysavy, M.

    I: Journal of Surface Analysis, Bind 9, 2002, s. 281-4.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    TY - JOUR

    T1 - Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K- Auger and K- conversion Spectra Emitted from Thin Films

    AU - Köver, L.

    AU - Tougaard, S.

    AU - Toth, J.

    AU - Varga, D.

    AU - Dragoun, O.

    AU - Koval'k, A.

    AU - Rysavy, M.

    PY - 2002

    Y1 - 2002

    M3 - Journal article

    VL - 9

    SP - 281

    EP - 284

    JO - Journal of Surface Analysis

    JF - Journal of Surface Analysis

    SN - 1341-1756

    ER -