Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification

A.I. Martin-Concepción, F. Yubero, J.P. Espinos, J. Garcia, S. Tougaard

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    OriginalsprogEngelsk
    TidsskriftSurface and Interface Analysis
    Vol/bind35
    Sider (fra-til)984-90
    ISSN0142-2421
    StatusUdgivet - 2003

    Citer dette

    @article{28786120ba9a11dc9626000ea68e967b,
    title = "Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification",
    author = "A.I. Martin-Concepci{\'o}n and F. Yubero and J.P. Espinos and J. Garcia and S. Tougaard",
    year = "2003",
    language = "English",
    volume = "35",
    pages = "984--90",
    journal = "Surface and Interface Analysis",
    issn = "0142-2421",
    publisher = "JohnWiley & Sons Ltd.",

    }

    Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification. / Martin-Concepción, A.I.; Yubero, F.; Espinos, J.P.; Garcia, J.; Tougaard, S.

    I: Surface and Interface Analysis, Bind 35, 2003, s. 984-90.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    TY - JOUR

    T1 - Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification

    AU - Martin-Concepción, A.I.

    AU - Yubero, F.

    AU - Espinos, J.P.

    AU - Garcia, J.

    AU - Tougaard, S.

    PY - 2003

    Y1 - 2003

    M3 - Journal article

    VL - 35

    SP - 984

    EP - 990

    JO - Surface and Interface Analysis

    JF - Surface and Interface Analysis

    SN - 0142-2421

    ER -