Description of ore particles from X-Ray Microtomography (XMT) images, supported by scanning electron microscope (SEM)-based image analysis

O. Furat; T. Leißner; R. Ditscherlein; O. Šedivý; M. Weber; K. Bachmann; J. Gutzmer; U. Peuker; V. Schmidt

doi:10.1017/S1431927618015076

Description of ore particles from X-Ray Microtomography (XMT) images, supported by scanning electron microscope (SEM)-based image analysis

O. Furat
, T. Leißner
, R. Ditscherlein
, O. Šedivý
, M. Weber
, K. Bachmann
, J. Gutzmer
, U. Peuker
, V. Schmidt

University of Ulm

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

Originalsprog	Engelsk
Tidsskrift	Microscopy and Microanalysis
ISSN	1431-9276
DOI	https://doi.org/10.1017/S1431927618015076
Status	Udgivet - 2018
Udgivet eksternt	Ja

Dokumenter og links

10.1017/S1431927618015076

SDU link

Tjek adgangen til materialet i Syddansk Universitetsbiblioteks søgemaskine

Andre filer og links

https://www.scopus.com/pages/publications/85054974537

Citationsformater

@article{92b5f0c2867847e59a3db6b3b0eae6e8,

title = "Description of ore particles from X-Ray Microtomography (XMT) images, supported by scanning electron microscope (SEM)-based image analysis",

author = "O. Furat and T. Lei{\ss}ner and R. Ditscherlein and O. {\v S}ediv{\'y} and M. Weber and K. Bachmann and J. Gutzmer and U. Peuker and V. Schmidt",

year = "2018",

doi = "10.1017/S1431927618015076",

language = "English",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Description of ore particles from X-Ray Microtomography (XMT) images, supported by scanning electron microscope (SEM)-based image analysis

AU - Furat, O.

AU - Leißner, T.

AU - Ditscherlein, R.

AU - Šedivý, O.

AU - Weber, M.

AU - Bachmann, K.

AU - Gutzmer, J.

AU - Peuker, U.

AU - Schmidt, V.

PY - 2018

Y1 - 2018

UR - https://www.scopus.com/pages/publications/85054974537

U2 - 10.1017/S1431927618015076

DO - 10.1017/S1431927618015076

M3 - Journal article

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -