Control of the Tip-surface Distance in Near-field Optical Microscopy

Sergei I. Bozhevolnyi, Ole Keller, M. Xiao

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

An experimental technique that makes use of the intensity of the interference pattern formed by light that propagates directly from the single-mode fiber tip and light that is reflected by the surface under an oblique angle of incidence is developed to control the tip–surface distance in near-field optical microscopy. It is shown that by using another fiber as a detector with a polished edge placed at the surface near the fiber tip one can determine the tip–surface separation with an accuracy better than 15 nm at distances less than 1 μm. The technique proposed is used to investigate the influence of the shape of the tip in near-field measurements.
OriginalsprogEngelsk
TidsskriftApplied Optics
Vol/bind32
Udgave nummer25
Sider (fra-til)4864-4868
ISSN0003-6935
DOI
StatusUdgivet - 1993
Udgivet eksterntJa

Fingeraftryk

Optical microscopy
near fields
microscopy
fibers
Fibers
Single mode fibers
Detectors
incidence
interference
detectors

Citer dette

Bozhevolnyi, Sergei I. ; Keller, Ole ; Xiao, M. / Control of the Tip-surface Distance in Near-field Optical Microscopy. I: Applied Optics. 1993 ; Bind 32, Nr. 25. s. 4864-4868.
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abstract = "An experimental technique that makes use of the intensity of the interference pattern formed by light that propagates directly from the single-mode fiber tip and light that is reflected by the surface under an oblique angle of incidence is developed to control the tip–surface distance in near-field optical microscopy. It is shown that by using another fiber as a detector with a polished edge placed at the surface near the fiber tip one can determine the tip–surface separation with an accuracy better than 15 nm at distances less than 1 μm. The technique proposed is used to investigate the influence of the shape of the tip in near-field measurements.",
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Control of the Tip-surface Distance in Near-field Optical Microscopy. / Bozhevolnyi, Sergei I.; Keller, Ole; Xiao, M.

I: Applied Optics, Bind 32, Nr. 25, 1993, s. 4864-4868.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

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AU - Bozhevolnyi, Sergei I.

AU - Keller, Ole

AU - Xiao, M.

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N2 - An experimental technique that makes use of the intensity of the interference pattern formed by light that propagates directly from the single-mode fiber tip and light that is reflected by the surface under an oblique angle of incidence is developed to control the tip–surface distance in near-field optical microscopy. It is shown that by using another fiber as a detector with a polished edge placed at the surface near the fiber tip one can determine the tip–surface separation with an accuracy better than 15 nm at distances less than 1 μm. The technique proposed is used to investigate the influence of the shape of the tip in near-field measurements.

AB - An experimental technique that makes use of the intensity of the interference pattern formed by light that propagates directly from the single-mode fiber tip and light that is reflected by the surface under an oblique angle of incidence is developed to control the tip–surface distance in near-field optical microscopy. It is shown that by using another fiber as a detector with a polished edge placed at the surface near the fiber tip one can determine the tip–surface separation with an accuracy better than 15 nm at distances less than 1 μm. The technique proposed is used to investigate the influence of the shape of the tip in near-field measurements.

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DO - 10.1364/AO.32.004864

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