Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

Walid Ibrahim*, Valeriu Beiu, Sanja Lazarova-Molnar

*Kontaktforfatter for dette arbejde

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

Resumé

This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.

OriginalsprogEngelsk
TitelProceedings - IDT'07 The 2nd International Design and Test Workshop
Antal sider6
Publikationsdato1. dec. 2007
Sider139-144
Artikelnummer4437447
ISBN (Trykt)9781424418251
DOI
StatusUdgivet - 1. dec. 2007
Begivenhed2nd international Design and Test Workshop, IDT 2007 - Cairo, Egypten
Varighed: 16. dec. 200718. dec. 2007

Konference

Konference2nd international Design and Test Workshop, IDT 2007
LandEgypten
ByCairo
Periode16/12/200718/12/2007

Fingeraftryk

Networks (circuits)
Computer simulation
Bayesian networks
Numerical methods
Monte Carlo simulation

Citer dette

Ibrahim, W., Beiu, V., & Lazarova-Molnar, S. (2007). Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo. I Proceedings - IDT'07 The 2nd International Design and Test Workshop (s. 139-144). [4437447] https://doi.org/10.1109/IDT.2007.4437447
Ibrahim, Walid ; Beiu, Valeriu ; Lazarova-Molnar, Sanja. / Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo. Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. s. 139-144
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title = "Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo",
abstract = "This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.",
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Ibrahim, W, Beiu, V & Lazarova-Molnar, S 2007, Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo. i Proceedings - IDT'07 The 2nd International Design and Test Workshop., 4437447, s. 139-144, 2nd international Design and Test Workshop, IDT 2007, Cairo, Egypten, 16/12/2007. https://doi.org/10.1109/IDT.2007.4437447

Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo. / Ibrahim, Walid; Beiu, Valeriu; Lazarova-Molnar, Sanja.

Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. s. 139-144 4437447.

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingKonferencebidrag i proceedingsForskningpeer review

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AU - Beiu, Valeriu

AU - Lazarova-Molnar, Sanja

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AB - This paper proposes a new approach to accurately evaluate the reliability of future nano-circuits. The proposed approach combines the accuracy and intuitiveness of Monte Carlo (MC) simulation with the simplicity and high modeling capacity of numerical simulations. This approach is important and timely as the expected size of future nano-circuits will make the exclusive usage of MC simulation timely prohibitive. At the same time, simulation methods that depend solely on numerical simulations are unfortunately not accurate enough. Experimental results show that the circuit reliability calculated by the proposed approach is very close to the reliability calculated based on MC simulation only. Index Terms - Reliability evaluation, nano-circuits, Monte Carlo, Bayesian networks, numerical methods.

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Ibrahim W, Beiu V, Lazarova-Molnar S. Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo. I Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. s. 139-144. 4437447 https://doi.org/10.1109/IDT.2007.4437447