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Sven Mosbæk Tougaard
civ. ing., PhD, dr.scient.
Institut for Fysik, Kemi og Farmaci
Professor MSO
,
Fysik
https://orcid.org/0000-0003-0909-8764
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+4565503530
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svt
sdu
dk
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Teknik og materialevidenskab
X ray photoelectron spectroscopy
100%
Inelastic scattering
73%
Photoelectrons
62%
Photoelectron spectroscopy
47%
Electron energy loss spectroscopy
42%
Electron scattering
35%
Energy dissipation
28%
Core shell nanoparticles
24%
X rays
24%
Electrons
23%
Optical properties
22%
Electron reflection
17%
Chemical analysis
16%
X ray spectroscopy
15%
Thin films
14%
Auger electron spectroscopy
13%
Electronic properties
13%
Polytetrafluoroethylenes
13%
Secondary ion mass spectrometry
13%
Cerium oxide
13%
Oxides
12%
Elastic scattering
11%
Zinc oxide
11%
Transmission electron microscopy
11%
Photoemission
10%
Core levels
10%
Oxygen
10%
Polymers
10%
Gases
10%
Factor analysis
10%
Scattering
9%
Electron Transport
9%
Annealing
9%
Lutetium
8%
Physical chemistry
7%
Adsorption
7%
Samarium
7%
Atoms
7%
Scanning electron microscopy
7%
Scandium
7%
Multilayer films
6%
Film thickness
6%
Transition metals
6%
Cesium
6%
Substrates
6%
Tin oxides
6%
Photons
6%
Kinetic energy
5%
Synchrotrons
5%
Indium
5%
Fysik og astronomi
photoelectron spectroscopy
41%
energy dissipation
40%
x rays
25%
electron energy
25%
computer programs
22%
electron spectroscopy
19%
excitation
19%
inelastic scattering
18%
photoelectrons
17%
scattering cross sections
16%
spectroscopy
16%
quantitative analysis
15%
Auger spectroscopy
14%
adsorption
13%
oxygen
13%
factor analysis
12%
scandium
11%
completeness
10%
electrons
10%
photoelectric emission
9%
optical properties
9%
secondary ion mass spectrometry
9%
nanoparticles
8%
desorption
7%
electronics
7%
principal components analysis
7%
oxides
6%
polymers
6%
transmission electron microscopy
6%
physical chemistry
6%
cross sections
6%
cerium oxides
6%
carbon
6%
calculators
6%
scanning electron microscopy
5%
phenols
5%
electron bombardment
5%
samarium
5%
problem solving
5%
formaldehyde
5%
ureas
5%
gas composition
5%
Kemiske forbindelser
Electron Scattering
27%
Inelastic Scattering
26%
X-Ray Photoelectron Spectroscopy
26%
Reflection Electron Energy Loss Spectroscopy
23%
Photoelectron
22%
Surface
13%
Photoelectron Spectroscopy
13%
Dielectric Response
12%
Energy
12%
Dielectric Function
11%
X-Ray Photoemission
11%
Electron Particle
10%
Poly(tetrafluoroethylene)
10%
Scanning Transmission Electron Microscopy
10%
Auger Electron Spectroscopy
10%
Secondary Ion Mass Spectroscopy
9%
Transmission Electron Energy Loss Spectroscopy
9%
Shape
9%
Electron Transport
6%
Nanoparticle
6%
Photoelectron Spectrum
6%
Physical Chemistry
5%
Photoemission
5%
Pressure
5%
Dioxygen
5%
